FXTH870911DT1

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Please see also our Restricted Substances Declaration.

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NXP Semiconductors
Product content declaration of FXTH870911DT1Last Revision (GMT):
Friday, 13 September 2024, 08:43:00 AM
Part TypePackage VersionPackage NameTotal part
weight
EnvironmentTermination2nd Level InterconnectFor more information:
Halogen Free (Cl+Br)Lead Free (Pb)EU RoHS CompliantPlatingBase Alloy
FXTH870911DT1SOT1575-1HQFN24296.949978 mg YesNoYesOtherCu alloye4contact us
Manufacturer Part Number (MPN)Effective DateVersionPb-free solderingSnPb solderingNumber of processing cyclesManufacturing
Moisture Sensitivity Level
/ Floor Life
Peak Package temperatureMax time at peak temperatureMoisture Sensitivity Level
/ Floor Life
Peak Package temperatureMax time at peak temperature
9353 119 365282023-11-248Not ApplicableNot ApplicableNot Applicable3 / 168 hours26040 sec.3External manufacturing
SubpartHomogeneous MaterialSubstanceCAS numberMass(mg)Mass(%) of
Material
Mass(%) of
Total part
CategoryDescription
Bonding Wire - Au 1Bonding Wire - AuGold and its compoundsGold, metal7440-57-50.09997499.9900000.033667
Miscellaneous substancesOther miscellaneous substances (less than 10%).0.0000100.0100000.000003
Subtotal0.099984100.00000000.033670
Bonding Wire - Au 2Bonding Wire - AuGold and its compoundsGold, metal7440-57-50.39995499.9900000.134687
Miscellaneous substancesOther miscellaneous substances (less than 10%).0.0000400.0100000.000013
Subtotal0.399994100.00000000.134701
Copper Lead-Frame, Pre-PlatedCopper Lead-Frame, Pre-PlatedCopper and its compoundsCopper, metal7440-50-86.98229496.9763002.351337
Gold and its compoundsGold, metal7440-57-50.0013680.0190000.000461
Iron and its compoundsIron, metal7439-89-60.1538142.1363000.051798
Lead and its compoundsLead, metallic lead and lead alloys7439-92-10.0000720.0010000.000024
Nickel and its compoundsNickel, metal7440-02-00.0573120.7960000.019300
Palladium and its compoundsPalladium, metal7440-05-30.0018000.0250000.000606
Phosphorus compoundsPhosphorus, elemental (not containing red allotrope)7723-14-00.0020450.0284000.000689
Silver and its compoundsSilver, metal7440-22-40.0012960.0180000.000436
Subtotal7.200000100.00000002.424651
Die EncapsulantDie EncapsulantEpoxy ResinsProprietary Material-Other Epoxy resins7.9720004.0000002.684627
Inorganic Silicon compoundsSilica, vitreous60676-86-0146.48550073.50000049.330025
Inorganic Silicon compoundsSilicon dioxide7631-86-931.88800016.00000010.738509
Inorganic compoundsCarbon Black1333-86-40.9965000.5000000.335578
Phenols and Phenolic ResinsProprietary Material-Other phenolic resins11.9580006.0000004.026941
Subtotal199.300000100.000000067.115681
Epoxy Adhesive 1Epoxy AdhesiveInorganic Silicon compoundsQuartz14808-60-70.12000030.0000000.040411
Organic Silicon compoundsDimethyl,methyl hydrogen siloxane68037-59-20.0364009.1000000.012258
Organic Silicon compoundsSiloxanes and silicones, di-Me, vinyl group-terminated68083-19-20.24000060.0000000.080822
Platinum and its compoundsOther platinum compounds0.0036000.9000000.001212
Subtotal0.400000100.00000000.134703
Epoxy Adhesive 2Epoxy AdhesiveAnhydridesPolybutadiene adducted with maleic anhydride25655-35-00.0005000.5000000.000168
Inorganic Silicon compoundsSilicon dioxide7631-86-90.0005000.5000000.000168
Organic compoundsOther Bismaleimides0.04900049.0000000.016501
PolymersPolytetrafluoroethylene9002-84-00.04000040.0000000.013470
Titanium and its compoundsTitanium (IV) Oxide13463-67-70.01000010.0000000.003368
Subtotal0.100000100.00000000.033676
Epoxy Adhesive 3Epoxy AdhesiveEpoxy ResinsOther Epoxy resins2.47500099.0000000.833474
Inorganic compoundsCarbon Black1333-86-40.0250001.0000000.008419
Subtotal2.500000100.00000000.841893
Epoxy Adhesive 4Epoxy AdhesiveEpoxy ResinsEpichlorohydrin, o-cresol, formaldehyde polymer29690-82-20.01000010.0000000.003368
Inorganic Silicon compoundsSilicon dioxide7631-86-90.02500025.0000000.008419
Phenols and Phenolic ResinsPhenol p-xylylene dimethyl ether copolymer26834-02-60.03000030.0000000.010103
Phenols and Phenolic ResinsPhenol, 4,4'-(1-methylethylidene)bis-, polymer with (chloromethyl)oxirane25068-38-60.02500025.0000000.008419
PolymersAcrylic acid ester copolymer78506-70-40.01000010.0000000.003368
Subtotal0.100000100.00000000.033676
LidLidChromium and Chromium III compoundsChromium, metal7440-47-312.62411818.1381004.251261
Inorganic Silicon compoundsSilicon7440-21-30.4377140.6289000.147403
Inorganic compoundsCarbon7440-44-00.0347300.0499000.011696
Inorganic compoundsSulfur7704-34-90.0020880.0030000.000703
Iron and its compoundsIron, metal7439-89-649.57434071.22750016.694509
Manganese and its compoundsManganese, metal7439-96-50.7295471.0482000.245680
Nickel and its compoundsNickel, metal7440-02-05.9890108.6049002.016841
Phosphorus compoundsPhosphorus, elemental (not containing red allotrope)7723-14-00.2084520.2995000.070198
Subtotal69.600000100.000000023.438291
Semiconductor Die 1Semiconductor DieInorganic Silicon compoundsSilicon7440-21-35.24300098.0000001.765617
Miscellaneous substancesOther miscellaneous substances (less than 10%).0.1070002.0000000.036033
Subtotal5.350000100.00000001.801650
Semiconductor Die 2Semiconductor DieInorganic Silicon compoundsSilicon, doped2.54800098.0000000.858057
Miscellaneous substancesOther miscellaneous substances (less than 10%).0.0520002.0000000.017511
Subtotal2.600000100.00000000.875568
Semiconductor Die 3DieInorganic Silicon compoundsSilicon7440-21-32.53526098.0000000.853767
Miscellaneous substancesOther miscellaneous substances (less than 10%).0.0517402.0000000.017424
Subtotal2.587000100.00000000.871190
GlassAluminum and its compoundsAluminum Oxides (Al2O3)1344-28-10.0001301.0000000.000044
Boron and its compoundsBoron oxide1303-86-20.0010408.0000000.000350
Inorganic Silicon compoundsSilicon dioxide7631-86-90.0003903.0000000.000131
Lead and its compoundsLead monooxide1317-36-80.00695553.5000000.002342
Lead and its compoundsLead titanium oxide (PbTiO3)12060-00-30.00448534.5000000.001510
Subtotal0.013000100.00000000.004378
Thermally Conductive Gel 1Thermally Conductive GelOrganic Silicon compoundsDimethyl,methyl hydrogen siloxane68037-59-20.2010006.0000000.067688
Organic Silicon compoundsDimethylvinylated and trimethylated silica68988-89-60.90450027.0000000.304597
Organic Silicon compoundsSiloxanes and silicones, di-Me, vinyl group-terminated68083-19-22.24450067.0000000.755851
Subtotal3.350000100.00000001.128136
Thermally Conductive Gel 2Thermally Conductive GelOrganic Silicon compoundsDimethylvinylated and trimethylated silica68988-89-61.21818136.3636000.410231
Organic Silicon compoundsSiloxanes and silicones, di-Me, vinyl group-terminated68083-19-22.03030460.6061000.683719
Organic Silicon compoundsTetra (trimethylsiloxy) silane3555-47-30.1015153.0303000.034186
Subtotal3.350000100.00000001.128136
Total296.949978100.0000000100.0000000
Note(s):
1Some materials contains substances with a generic description as the actual composition of the substances are either considered proprietary or no official CAS number is available. If a CAS number is given, it is the closest match available
Disclaimer
All information in this document is furnished for exploratory or indicative purposes only. All information in this document is believed to be accurate and reliable. However, NXP does not give any representations or warranties as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. NXP may make changes to information published in this document at any time and without notice. Minor deviations may occur in the products from different manufacturing location. This document supersedes and replaces all information supplied prior to the publication hereof. Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights.
NXP Semiconductors
产品内容声明 FXTH870911DT1
Product content declaration of FXTH870911DT1
上次修订 Last Revision (GMT):
Friday, 13 September 2024, 08:43:00 AM
部件名称
Name of the part
均质材料
Homogeneous Material
有毒或有害物质和元素 (Toxic or hazardous Substances and Elements)
铅(Pb)镉(Cd)汞(Hg)六价铬(Cr-VI)多溴联苯(PBB)多溴二苯醚(PBDE)
焊丝-金
Bonding Wire - Au 1
焊丝-金
Bonding Wire - Au
OOOOOO
焊丝-金
Bonding Wire - Au 2
焊丝-金
Bonding Wire - Au
OOOOOO
铜引线框架,预镀
Copper Lead-Frame, Pre-Plated
铜引线框架,预镀
Copper Lead-Frame, Pre-Plated
OOOOOO
芯片密封胶
Die Encapsulant
芯片密封胶
Die Encapsulant
OOOOOO
环氧树脂粘合剂
Epoxy Adhesive 1
环氧树脂粘合剂
Epoxy Adhesive
OOOOOO
环氧树脂粘合剂
Epoxy Adhesive 2
环氧树脂粘合剂
Epoxy Adhesive
OOOOOO
环氧树脂粘合剂
Epoxy Adhesive 3
环氧树脂粘合剂
Epoxy Adhesive
OOOOOO
环氧树脂粘合剂
Epoxy Adhesive 4
环氧树脂粘合剂
Epoxy Adhesive
OOOOOO
盖子
Lid
盖子
Lid
OOOOOO
半导体芯片
Semiconductor Die 1
半导体芯片
Semiconductor Die
OOOOOO
半导体芯片
Semiconductor Die 2
半导体芯片
Semiconductor Die
OOOOOO
半导体芯片
Semiconductor Die 3
半导体芯片
Die
OOOOOO

玻璃
Glass
XOOOOO
导热凝胶
Thermally Conductive Gel 1
导热凝胶
Thermally Conductive Gel
OOOOOO
导热凝胶
Thermally Conductive Gel 2
导热凝胶
Thermally Conductive Gel
OOOOOO
O: 表示该有毒有害物质在该部件所有均质材料中的含量均在SJ/T11363-2006标准规定的限量要求以下。
O: Indicates all homogeneous materials hazardous substances content are below the SJ/T11363-2006 MCV limit.
X: 该有毒有害物质至少在该部件的某一均质材料中的含量超出SJ/T11363-2006标准规定的限量要求。
X: Indicates that the hazardous substance content contained in any one of the homogeneous materials of the part exceeded the MCV limits specified in the Standard SJ/T 11363-2006.
备注: 该半导体产品的环保使用期限(EFUP)为50年。
Remark: This semiconductor product has an environmental friendly use period (EFUP) of 50 years.
免责声明
Disclaimer
本文件中的所有信息只为考察或指示目的。本文件中的所有信息被认为是精确和可靠的。然而,恩智浦不对该等信息的精确性和完整性给予任何陈述和保证,且恩智浦不对使用该等信息造成的后果承担责任。恩智浦可以在任何时候对文件中公布的信息加以修改,无需经过通知。不同生产地的产品可能存在微小偏差。本文件取代先于此次公布的所有信息。本文件中任何信息都不能被解释为对承诺开放的销售产品的要约,或者授予、让与或暗示任何版权、专利或者其它工业或知识产权的任何许可。

All information in this document is furnished for exploratory or indicative purposes only. All information in this document is believed to be accurate and reliable. However, NXP does not give any representations or warranties as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. NXP may make changes to information published in this document at any time and without notice. Minor deviations may occur in the products from different manufacturing location. This document supersedes and replaces all information supplied prior to the publication hereof. Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights.
NXP Semiconductors
Compliance Documentation of FXTH870911DT1Last Revision (GMT):
Friday, 13 September 2024, 08:43:00 AM
SubpartHomogeneous MaterialCertificate of Analysis(CoA)
RoHSPhthalates *Halogens *Antimony *
Bonding Wire - Au 1Test Report
5 Mar 2024
Test Report
5 Mar 2024
Test Report
5 Mar 2024
Test Report
5 Mar 2024
Bonding Wire - Au 2Test Report
28 Feb 2024
Test Report
28 Feb 2024
Test Report
28 Feb 2024
Test Report
28 Feb 2024
Copper Lead-Frame, Pre-PlatedTest Report
14 Jan 2019
Test Report
14 Jan 2019
Test Report
14 Jan 2019
Test Report
14 Jan 2019
Die EncapsulantTest Report
14 Nov 2023
Test Report
14 Nov 2023
Test Report
14 Nov 2023
Test Report
14 Nov 2023
Epoxy Adhesive 1Test Report
13 Oct 2023
Test Report
13 Oct 2023
Test Report
13 Oct 2023
Test Report
13 Oct 2023
Epoxy Adhesive 2Test Report
29 Dec 2023
Test Report
29 Dec 2023
Test Report
29 Dec 2023
Test Report
29 Dec 2023
Epoxy Adhesive 3Test Report
12 Dec 2023
Test Report
12 Dec 2023
Test Report
12 Dec 2023
Test Report
12 Dec 2023
Epoxy Adhesive 4Test Report
22 Nov 2023
Test Report
22 Nov 2023
Test Report
22 Nov 2023
Test Report
22 Nov 2023
LidTest Report
22 Dec 2023
Test Report
22 Dec 2023
Test Report
22 Dec 2023
Test Report
22 Dec 2023
Semiconductor Die 1Test Report
19 Dec 2023
Test Report
19 Dec 2023
Test Report
19 Dec 2023
Test Report
19 Dec 2023
Semiconductor Die 2Test Report
2 Aug 2023
Test Report
2 Aug 2023
Test Report
2 Aug 2023
Test Report
2 Aug 2023
Semiconductor Die 3CAP DIETest Report
2 Aug 2023
Test Report
2 Aug 2023
Test Report
2 Aug 2023
Test Report
2 Aug 2023
LEAD GLASS FRIT DIETest Report
2 Aug 2023
Test Report
2 Aug 2023
Test Report
2 Aug 2023
Test Report
2 Aug 2023
Thermally Conductive Gel 1Test Report
3 May 2021
Test Report
3 May 2021
Test Report
3 May 2021
Test Report
3 May 2021
Thermally Conductive Gel 2Test Report
3 May 2021
Test Report
3 May 2021
Test Report
3 May 2021
Test Report
3 May 2021
For more information: contact us
Note(s):
* NXP does not commit to providing this report for all product materials!
Disclaimer
All information in this document is furnished for exploratory or indicative purposes only. All information in this document is believed to be accurate and reliable. However, NXP does not give any representations or warranties as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. NXP may make changes to information published in this document at any time and without notice. Minor deviations may occur in the products from different manufacturing location. This document supersedes and replaces all information supplied prior to the publication hereof. Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights.