A2T18H100-25SR3

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Please see also our Restricted Substances Declaration.

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NXP Semiconductors
Product content declaration of A2T18H100-25SR3Last Revision (GMT):
Saturday, 16 September 2023, 08:13:00 AM
Part TypePackage VersionPackage NameTotal part
weight
EnvironmentTermination2nd Level InterconnectFor more information:
Halogen Free (Cl+Br)Lead Free (Pb)EU RoHS CompliantPlatingBase Alloy
A2T18H100-25SR3SOT1797-1CFM8F4292.921895 mg YesYesYesN/ANot Applicablee4contact us
Manufacturer Part Number (MPN)Effective DateVersionPb-free solderingSnPb solderingNumber of processing cyclesManufacturing
Moisture Sensitivity Level
/ Floor Life
Peak Package temperatureMax time at peak temperatureMoisture Sensitivity Level
/ Floor Life
Peak Package temperatureMax time at peak temperature
9353 120 271282023-11-247NA / Not Available26040 sec.Not ApplicableNot ApplicableNot Applicable3Kuala Lumpur, Malaysia
SubpartHomogeneous MaterialSubstanceCAS numberMass(mg)Mass(%) of
Material
Mass(%) of
Total part
CategoryDescription
Bonding Wire - AlBonding Wire - AlAluminum and its compoundsAluminum, metal7429-90-519.27395098.8450000.448970
Inorganic Silicon compoundsSilicon7440-21-30.2242401.1500000.005223
Nickel and its compoundsNickel, metal7440-02-00.0009750.0050000.000023
Subtotal19.499165100.00000000.454217
CapCeramicAluminum and its compoundsAluminum Oxides (Al2O3)1344-28-1566.46182496.00000013.195251
Inorganic Silicon compoundsSilicon dioxide7631-86-917.7019323.0000000.412352
Inorganic compoundsOther inorganic compounds5.9006441.0000000.137451
Subtotal590.064400100.000000013.745053
EpoxyInorganic Silicon compoundsSilicon dioxide7631-86-99.91602045.0000000.230985
Phenols and Phenolic Resins2-[[4-[2-[4-[1,1-bis[4-(oxiran-2-ylmethoxy)phenyl]ethyl]phenyl]propan-2-yl]phenoxy]methyl]oxirane115254-47-212.11958055.0000000.282315
Subtotal22.035600100.00000000.513301
Header Assembly/FlangeCeramicAluminum and its compoundsAluminum Oxides (Al2O3)1344-28-1222.69929889.4000005.187593
Chromium and Chromium III compoundsDichromium trioxide1308-38-914.9462626.0000000.348161
Inorganic Silicon compoundsSilicon dioxide7631-86-97.4731313.0000000.174080
Inorganic compoundsOther inorganic compounds3.9856701.6000000.092843
Subtotal249.104360100.00000005.802676
ConductorAluminum and its compoundsAluminum Oxides (Al2O3)1344-28-16.73658618.4000000.156923
Inorganic compoundsOther inorganic compounds0.5125661.4000000.011940
Molybdenum and its compoundsMolybdenum, metal7439-98-70.9152972.5000000.021321
Tungsten and its compoundsTungsten, metal7440-33-728.44743177.7000000.662659
Subtotal36.611880100.00000000.852843
FlangeCopper and its compoundsCopper, metal7440-50-81552.89504451.80000036.173382
Molybdenum and its compoundsMolybdenum, metal7439-98-71444.97183648.20000033.659402
Subtotal2997.866880100.000000069.832784
Gold PlatingGold and its compoundsGold, metal7440-57-56.81979299.9990000.158861
Lead and its compoundsLead, metallic lead and lead alloys7439-92-10.0000680.0010000.000002
Subtotal6.819860100.00000000.158863
Iron AlloyIron and its compoundsIron, metal7439-89-6112.42000858.0000002.618729
Nickel and its compoundsNickel, metal7440-02-081.40759242.0000001.896321
Subtotal193.827600100.00000004.515051
Metal BrazeCopper and its compoundsCopper, metal7440-50-812.96491328.0000000.302007
Silver and its compoundsSilver, metal7440-22-433.33834772.0000000.776589
Subtotal46.303260100.00000001.078595
Nickel Cobalt PlatingCobalt and its compoundsCobalt, metal7440-48-416.79839230.0000000.391304
Nickel and its compoundsNickel, metal7440-02-039.19624870.0000000.913044
Subtotal55.994640100.00000001.304348
Palladium PlatingMiscellaneous substancesOther miscellaneous substances (less than 10%).0.0028710.1000000.000067
Palladium and its compoundsPalladium, metal7440-05-32.86864899.9000000.066823
Subtotal2.871520100.00000000.066890
Semiconductor Die 1Semiconductor DieGold and its compoundsGold, metal7440-57-50.1162801.0200000.002709
Inorganic Silicon compoundsSilicon, doped11.05804697.0004000.257588
Miscellaneous substancesOther miscellaneous substances (less than 10%).0.2256741.9796000.005257
Subtotal11.400000100.00000000.265553
Semiconductor Die 2Semiconductor DieInorganic Silicon compoundsSilicon, doped17.76918498.0000000.413918
Miscellaneous substancesOther miscellaneous substances (less than 10%).0.3626362.0000000.008447
Subtotal18.131820100.00000000.422366
Semiconductor Die 3Semiconductor DieInorganic Silicon compoundsSilicon, doped5.08709298.0000000.118499
Miscellaneous substancesOther miscellaneous substances (less than 10%).0.1038182.0000000.002418
Subtotal5.190910100.00000000.120918
Semiconductor Die 4Semiconductor DieInorganic Silicon compoundsSilicon, doped12.90240089.6000000.300550
Miscellaneous substancesOther miscellaneous substances (less than 10%).0.1296000.9000000.003019
Nickel and its compoundsNickel, metal7440-02-00.0720000.5000000.001677
Silver and its compoundsSilver, metal7440-22-40.0453600.3150000.001057
Tin and its compoundsTin, metal7440-31-51.2506408.6850000.029133
Subtotal14.400000100.00000000.335436
Semiconductor Die 5Semiconductor DieGold and its compoundsGold, metal7440-57-50.1162801.0200000.002709
Inorganic Silicon compoundsSilicon, doped11.05804697.0004000.257588
Miscellaneous substancesOther miscellaneous substances (less than 10%).0.2256741.9796000.005257
Subtotal11.400000100.00000000.265553
Semiconductor Die 6Semiconductor DieGold and its compoundsGold, metal7440-57-50.1162801.0200000.002709
Inorganic Silicon compoundsSilicon, doped11.05804697.0004000.257588
Miscellaneous substancesOther miscellaneous substances (less than 10%).0.2256741.9796000.005257
Subtotal11.400000100.00000000.265553
Total4292.921895100.0000000100.0000000
Note(s):
1Some materials contains substances with a generic description as the actual composition of the substances are either considered proprietary or no official CAS number is available. If a CAS number is given, it is the closest match available
Disclaimer
All information in this document is furnished for exploratory or indicative purposes only. All information in this document is believed to be accurate and reliable. However, NXP does not give any representations or warranties as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. NXP may make changes to information published in this document at any time and without notice. Minor deviations may occur in the products from different manufacturing location. This document supersedes and replaces all information supplied prior to the publication hereof. Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights.
NXP Semiconductors
产品内容声明 A2T18H100-25SR3
Product content declaration of A2T18H100-25SR3
上次修订 Last Revision (GMT):
Saturday, 16 September 2023, 08:13:00 AM
部件名称
Name of the part
均质材料
Homogeneous Material
有毒或有害物质和元素 (Toxic or hazardous Substances and Elements)
铅(Pb)镉(Cd)汞(Hg)六价铬(Cr-VI)多溴联苯(PBB)多溴二苯醚(PBDE)
焊丝-铝
Bonding Wire - Al
焊丝-铝
Bonding Wire - Al
OOOOOO
盖子
Cap
陶瓷的
Ceramic
OOOOOO

环氧胶
Epoxy
OOOOOO
封装焊头/法兰
Header Assembly/Flange
陶瓷的
Ceramic
OOOOOO

导体
Conductor
OOOOOO

法兰盘
Flange
OOOOOO

镀金材料
Gold Plating
OOOOOO

铁合金
Iron Alloy
OOOOOO

金属钎焊
Metal Braze
OOOOOO

镍钴电镀
Nickel Cobalt Plating
OOOOOO

钯镀层
Palladium Plating
OOOOOO
半导体芯片
Semiconductor Die 1
半导体芯片
Semiconductor Die
OOOOOO
半导体芯片
Semiconductor Die 2
半导体芯片
Semiconductor Die
OOOOOO
半导体芯片
Semiconductor Die 3
半导体芯片
Semiconductor Die
OOOOOO
半导体芯片
Semiconductor Die 4
半导体芯片
Semiconductor Die
OOOOOO
半导体芯片
Semiconductor Die 5
半导体芯片
Semiconductor Die
OOOOOO
半导体芯片
Semiconductor Die 6
半导体芯片
Semiconductor Die
OOOOOO
O: 表示该有毒有害物质在该部件所有均质材料中的含量均在SJ/T11363-2006标准规定的限量要求以下。
O: Indicates all homogeneous materials hazardous substances content are below the SJ/T11363-2006 MCV limit.
X: 该有毒有害物质至少在该部件的某一均质材料中的含量超出SJ/T11363-2006标准规定的限量要求。
X: Indicates that the hazardous substance content contained in any one of the homogeneous materials of the part exceeded the MCV limits specified in the Standard SJ/T 11363-2006.
备注: 该半导体产品具有无限期的环保使用期限(EFUP)。
Remark: This semiconductor product has an indefinite environmental friendly use period (EFUP).
免责声明
Disclaimer
本文件中的所有信息只为考察或指示目的。本文件中的所有信息被认为是精确和可靠的。然而,恩智浦不对该等信息的精确性和完整性给予任何陈述和保证,且恩智浦不对使用该等信息造成的后果承担责任。恩智浦可以在任何时候对文件中公布的信息加以修改,无需经过通知。不同生产地的产品可能存在微小偏差。本文件取代先于此次公布的所有信息。本文件中任何信息都不能被解释为对承诺开放的销售产品的要约,或者授予、让与或暗示任何版权、专利或者其它工业或知识产权的任何许可。

All information in this document is furnished for exploratory or indicative purposes only. All information in this document is believed to be accurate and reliable. However, NXP does not give any representations or warranties as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. NXP may make changes to information published in this document at any time and without notice. Minor deviations may occur in the products from different manufacturing location. This document supersedes and replaces all information supplied prior to the publication hereof. Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights.
NXP Semiconductors
Compliance Documentation of A2T18H100-25SR3Last Revision (GMT):
Saturday, 16 September 2023, 08:13:00 AM
SubpartHomogeneous MaterialCertificate of Analysis(CoA)
RoHSPhthalates *Halogens *Antimony *
Bonding Wire - AlTest Report
18 Sep 2023
Test Report
18 Sep 2023
Test Report
18 Sep 2023
Test Report
18 Sep 2023
CapCERAMICTest Report
30 Jun 2021
Test Report
30 Jun 2021
Test Report
30 Jun 2021
Test Report
1 Jul 2020
EPOXYTest Report
30 Jun 2021
Test Report
30 Jun 2021
Test Report
1 Jul 2020
Not Available
Header Assembly/FlangeALLOY 42Test Report
11 May 2023
Test Report
11 May 2023
Test Report
11 May 2023
Test Report
11 May 2023
AU PLATINGTest Report
2 Aug 2021
Not AvailableNot AvailableNot Available
FLANGETest Report
18 Mar 2021
Test Report
18 Mar 2021
Test Report
18 Mar 2021
Not Available
PD PLATINGTest Report
10 Feb 2020
Test Report
10 Feb 2020Test Report
18 Jan 2021
Not AvailableNot Available
Semiconductor Die 1Test Report
18 Jul 2022
Test Report
18 Jul 2022
Test Report
18 Jul 2022
Test Report
18 Jul 2022
Semiconductor Die 2Test Report
22 Oct 2019
Test Report
22 Oct 2019
Test Report
22 Oct 2019
Test Report
22 Oct 2019
Semiconductor Die 3Test Report
22 Oct 2019
Test Report
22 Oct 2019
Test Report
22 Oct 2019
Test Report
22 Oct 2019
Semiconductor Die 4Test Report
2 Aug 2023
Test Report
2 Aug 2023
Test Report
2 Aug 2023
Test Report
2 Aug 2023
Semiconductor Die 5Test Report
2 Aug 2023
Test Report
2 Aug 2023
Test Report
2 Aug 2023
Test Report
2 Aug 2023
Semiconductor Die 6Test Report
18 Jul 2022
Test Report
18 Jul 2022
Test Report
18 Jul 2022
Test Report
18 Jul 2022
For more information: contact us
Note(s):
* NXP does not commit to providing this report for all product materials!
Disclaimer
All information in this document is furnished for exploratory or indicative purposes only. All information in this document is believed to be accurate and reliable. However, NXP does not give any representations or warranties as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. NXP may make changes to information published in this document at any time and without notice. Minor deviations may occur in the products from different manufacturing location. This document supersedes and replaces all information supplied prior to the publication hereof. Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights.