A2T14H450-23NR6
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| NXP Semiconductors | ||
| Product content declaration of A2T14H450-23NR6 | Last Revision (GMT): Wednesday, 06 November 2024, 03:05:00 PM | |
| Part Type | Package Version | Package Name | Total part weight | Environment | Termination | 2nd Level Interconnect | For more information: | |||
|---|---|---|---|---|---|---|---|---|---|---|
| Halogen Free (Cl+Br) | Lead Free (Pb) | EU RoHS Compliant | Plating | Base Alloy | ||||||
| A2T14H450-23NR6 | SOT1819 | FM6F | 5603.513350 mg | Yes | Yes | Yes | Tin (Sn) | Cu alloy | e3 | contact us |
| Manufacturer Part Number (MPN) | Effective Date | Version | Pb-free soldering | SnPb soldering | Number of processing cycles | Manufacturing | ||||
|---|---|---|---|---|---|---|---|---|---|---|
| Moisture Sensitivity Level / Floor Life | Peak Package temperature | Max time at peak temperature | Moisture Sensitivity Level / Floor Life | Peak Package temperature | Max time at peak temperature | |||||
| 9353 162 14528 | 2023-11-24 | 5 | 3 / 168 hours | 260 | 40 sec. | Not Applicable | Not Applicable | Not Applicable | 3 | Kuala Lumpur, Malaysia |
| Subpart | Homogeneous Material | Substance | CAS number | Mass(mg) | Mass(%) of Material | Mass(%) of Total part | |
|---|---|---|---|---|---|---|---|
| Category | Description | ||||||
| Bonding Wire - Al | Bonding Wire - Al | Aluminum and its compounds | Aluminum, metal | 7429-90-5 | 2.639162 | 98.845000 | 0.047098 |
| Inorganic Silicon compounds | Silicon | 7440-21-3 | 0.030705 | 1.150000 | 0.000548 | ||
| Nickel and its compounds | Nickel, metal | 7440-02-0 | 0.000133 | 0.005000 | 0.000002 | ||
| Subtotal | 2.670000 | 100.0000000 | 0.047649 | ||||
| Copper Lead-Frame | Copper Alloy | Copper and its compounds | Copper, metal | 7440-50-8 | 620.770090 | 97.291000 | 11.078230 |
| Iron and its compounds | Iron, metal | 7439-89-6 | 15.121904 | 2.370000 | 0.269865 | ||
| Lead and its compounds | Lead, metallic lead and lead alloys | 7439-92-1 | 0.108469 | 0.017000 | 0.001936 | ||
| Phosphorus compounds | Phosphorus, elemental (not containing red allotrope) | 7723-14-0 | 1.059171 | 0.166000 | 0.018902 | ||
| Tin and its compounds | Tin, metal | 7440-31-5 | 0.191416 | 0.030000 | 0.003416 | ||
| Zinc and its compounds | Zinc, metal | 7440-66-6 | 0.803949 | 0.126000 | 0.014347 | ||
| Subtotal | 638.055000 | 100.0000000 | 11.386695 | ||||
| Silver Plating | Miscellaneous substances | Proprietary Material-Other miscellaneous substances. | 0.000644 | 0.010000 | 0.000012 | ||
| Silver and its compounds | Silver, metal | 7440-22-4 | 6.444356 | 99.990000 | 0.115006 | ||
| Subtotal | 6.445000 | 100.0000000 | 0.115017 | ||||
| Die Encapsulant | Die Encapsulant | Epoxy Resins | Epichlorohydrin, o-cresol, formaldehyde polymer | 29690-82-2 | 226.245000 | 15.000000 | 4.037556 |
| Inorganic Silicon compounds | Silica, vitreous | 60676-86-0 | 1199.098500 | 79.500000 | 21.399048 | ||
| Inorganic Silicon compounds | Silicon dioxide | 7631-86-9 | 75.415000 | 5.000000 | 1.345852 | ||
| Inorganic compounds | Carbon Black | 1333-86-4 | 7.541500 | 0.500000 | 0.134585 | ||
| Subtotal | 1508.300000 | 100.0000000 | 26.917041 | ||||
| Heat Sink | Copper Alloy | Copper and its compounds | Copper, metal | 7440-50-8 | 3076.193300 | 99.990000 | 54.897581 |
| Zirconium and its compounds | Zirconium, metal | 7440-67-7 | 0.307650 | 0.010000 | 0.005490 | ||
| Subtotal | 3076.500950 | 100.0000000 | 54.903072 | ||||
| Gold Plating | Gold and its compounds | Gold, metal | 7440-57-5 | 13.716470 | 99.900000 | 0.244783 | |
| Miscellaneous substances | Other miscellaneous substances (less than 10%). | 0.013730 | 0.100000 | 0.000245 | |||
| Subtotal | 13.730200 | 100.0000000 | 0.245028 | ||||
| Metallization Layer | Cobalt and its compounds | Cobalt, metal | 7440-48-4 | 9.040401 | 99.900000 | 0.161334 | |
| Miscellaneous substances | Other miscellaneous substances (less than 10%). | 0.009050 | 0.100000 | 0.000161 | |||
| Subtotal | 9.049450 | 100.0000000 | 0.161496 | ||||
| Nickel Plating | Miscellaneous substances | Other miscellaneous substances (less than 10%). | 0.021219 | 0.100000 | 0.000379 | ||
| Nickel and its compounds | Nickel, metal | 7440-02-0 | 21.198181 | 99.900000 | 0.378302 | ||
| Subtotal | 21.219400 | 100.0000000 | 0.378680 | ||||
| Post-plating - Lead Free | Post-plating - Lead Free | Lead and its compounds | Lead, metallic lead and lead alloys | 7439-92-1 | 0.007700 | 0.020000 | 0.000137 |
| Tin and its compounds | Tin, metal | 7440-31-5 | 38.492300 | 99.980000 | 0.686932 | ||
| Subtotal | 38.500000 | 100.0000000 | 0.687069 | ||||
| Semiconductor Die 1 | Semiconductor Die | Inorganic Silicon compounds | Silicon, doped | 27.955200 | 89.600000 | 0.498887 | |
| Miscellaneous substances | Other miscellaneous substances (less than 10%). | 0.280800 | 0.900000 | 0.005011 | |||
| Nickel and its compounds | Nickel, metal | 7440-02-0 | 0.156000 | 0.500000 | 0.002784 | ||
| Silver and its compounds | Silver, metal | 7440-22-4 | 0.098280 | 0.315000 | 0.001754 | ||
| Tin and its compounds | Tin, metal | 7440-31-5 | 2.709720 | 8.685000 | 0.048357 | ||
| Subtotal | 31.200000 | 100.0000000 | 0.556794 | ||||
| Semiconductor Die 2 | Semiconductor Die | Inorganic Silicon compounds | Silicon, doped | 201.471683 | 98.000000 | 3.595453 | |
| Miscellaneous substances | Other miscellaneous substances (less than 10%). | 4.111667 | 2.000000 | 0.073377 | |||
| Subtotal | 205.583350 | 100.0000000 | 3.668830 | ||||
| Semiconductor Die 3 | Semiconductor Die | Inorganic Silicon compounds | Silicon, doped | 10.319400 | 98.000000 | 0.184160 | |
| Miscellaneous substances | Other miscellaneous substances (less than 10%). | 0.210600 | 2.000000 | 0.003758 | |||
| Subtotal | 10.530000 | 100.0000000 | 0.187918 | ||||
| Semiconductor Die 4 | Semiconductor Die | Gold and its compounds | Gold, metal | 7440-57-5 | 0.107406 | 1.020000 | 0.001917 |
| Inorganic Silicon compounds | Silicon, doped | 10.214142 | 97.000400 | 0.182281 | |||
| Miscellaneous substances | Other miscellaneous substances (less than 10%). | 0.208452 | 1.979600 | 0.003720 | |||
| Subtotal | 10.530000 | 100.0000000 | 0.187918 | ||||
| Semiconductor Die 5 | Semiconductor Die | Gold and its compounds | Gold, metal | 7440-57-5 | 0.318240 | 1.020000 | 0.005679 |
| Inorganic Silicon compounds | Silicon, doped | 30.264125 | 97.000400 | 0.540092 | |||
| Miscellaneous substances | Other miscellaneous substances (less than 10%). | 0.617635 | 1.979600 | 0.011022 | |||
| Subtotal | 31.200000 | 100.0000000 | 0.556794 | ||||
| Total | 5603.513350 | 100.0000000 | 100.0000000 | ||||
| Note(s): |
|---|
| 1Some materials contains substances with a generic description as the actual composition of the substances are either considered proprietary or no official CAS number is available. If a CAS number is given, it is the closest match available |
| Disclaimer |
|---|
| All information in this document is furnished for exploratory or indicative purposes only. All information in this document is believed to be accurate and reliable. However, NXP does not give any representations or warranties as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. NXP may make changes to information published in this document at any time and without notice. Minor deviations may occur in the products from different manufacturing location. This document supersedes and replaces all information supplied prior to the publication hereof. Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights. |
| NXP Semiconductors | ||
| 产品内容声明 A2T14H450-23NR6 Product content declaration of A2T14H450-23NR6 | 上次修订 Last Revision (GMT): Wednesday, 06 November 2024, 03:05:00 PM | |
| 部件名称 Name of the part | 均质材料 Homogeneous Material | 有毒或有害物质和元素 (Toxic or hazardous Substances and Elements) | |||||
|---|---|---|---|---|---|---|---|
| 铅(Pb) | 镉(Cd) | 汞(Hg) | 六价铬(Cr-VI) | 多溴联苯(PBB) | 多溴二苯醚(PBDE) | ||
| 焊丝-铝 Bonding Wire - Al | 焊丝-铝 Bonding Wire - Al | O | O | O | O | O | O |
| 铜引线框架 Copper Lead-Frame | 铜合金 Copper Alloy | O | O | O | O | O | O |
| | 镀银 Silver Plating | O | O | O | O | O | O |
| 芯片密封胶 Die Encapsulant | 芯片密封胶 Die Encapsulant | O | O | O | O | O | O |
| 散热器 Heat Sink | 铜合金 Copper Alloy | O | O | O | O | O | O |
| | 镀金材料 Gold Plating | O | O | O | O | O | O |
| | 金属化层 Metallization Layer | O | O | O | O | O | O |
| | 镀镍层 Nickel Plating | O | O | O | O | O | O |
| 封装后电镀- 无铅 Post-plating - Lead Free | 封装后电镀- 无铅 Post-plating - Lead Free | O | O | O | O | O | O |
| 半导体芯片 Semiconductor Die 1 | 半导体芯片 Semiconductor Die | O | O | O | O | O | O |
| 半导体芯片 Semiconductor Die 2 | 半导体芯片 Semiconductor Die | O | O | O | O | O | O |
| 半导体芯片 Semiconductor Die 3 | 半导体芯片 Semiconductor Die | O | O | O | O | O | O |
| 半导体芯片 Semiconductor Die 4 | 半导体芯片 Semiconductor Die | O | O | O | O | O | O |
| 半导体芯片 Semiconductor Die 5 | 半导体芯片 Semiconductor Die | O | O | O | O | O | O |
| O: 表示该有毒有害物质在该部件所有均质材料中的含量均在SJ/T11363-2006标准规定的限量要求以下。 |
| O: Indicates all homogeneous materials hazardous substances content are below the SJ/T11363-2006 MCV limit. |
| X: 该有毒有害物质至少在该部件的某一均质材料中的含量超出SJ/T11363-2006标准规定的限量要求。 |
| X: Indicates that the hazardous substance content contained in any one of the homogeneous materials of the part exceeded the MCV limits specified in the Standard SJ/T 11363-2006. |
| 备注： 该半导体产品具有无限期的环保使用期限（EFUP）。 |
| Remark: This semiconductor product has an indefinite environmental friendly use period (EFUP). |
| 免责声明 Disclaimer |
|---|
| 本文件中的所有信息只为考察或指示目的。本文件中的所有信息被认为是精确和可靠的。然而，恩智浦不对该等信息的精确性和完整性给予任何陈述和保证，且恩智浦不对使用该等信息造成的后果承担责任。恩智浦可以在任何时候对文件中公布的信息加以修改，无需经过通知。不同生产地的产品可能存在微小偏差。本文件取代先于此次公布的所有信息。本文件中任何信息都不能被解释为对承诺开放的销售产品的要约，或者授予、让与或暗示任何版权、专利或者其它工业或知识产权的任何许可。 All information in this document is furnished for exploratory or indicative purposes only. All information in this document is believed to be accurate and reliable. However, NXP does not give any representations or warranties as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. NXP may make changes to information published in this document at any time and without notice. Minor deviations may occur in the products from different manufacturing location. This document supersedes and replaces all information supplied prior to the publication hereof. Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights. |
| NXP Semiconductors | ||
| Compliance Documentation of A2T14H450-23NR6 | Last Revision (GMT): Wednesday, 06 November 2024, 03:05:00 PM | |
| Subpart | Homogeneous Material | Certificate of Analysis(CoA) | |||
|---|---|---|---|---|---|
| RoHS | Phthalates * | Halogens * | Antimony * | ||
| Bonding Wire - Al | Test Report 11 Sep 2024 | Test Report 11 Sep 2024 | Test Report 11 Sep 2024 | Test Report 11 Sep 2024 | |
| Copper Lead-Frame | CDA 194 | Test Report 21 Feb 2023 | Test Report 21 Feb 2023 | Test Report 21 Feb 2023 | Test Report 21 Feb 2023 |
| NI PLATING | Test Report 20 Feb 2023 | Test Report 20 Feb 2023 | Test Report 20 Feb 2023 | Test Report 20 Feb 2023 | |
| Die Encapsulant | Test Report 30 Apr 2024 | Test Report 30 Apr 2024 | Test Report 30 Apr 2024 | Test Report 30 Apr 2024 | |
| Heat Sink | CDA 151 | Test Report 27 Aug 2021 | Test Report 27 Aug 2021 | Test Report 27 Aug 2021 | Test Report 27 Aug 2021 |
| CU NICO AU PLATING | Test Report 20 Feb 2023 | Test Report 20 Feb 2023 | Test Report 20 Feb 2023 | Test Report 20 Feb 2023 | |
| Post-plating - Lead Free | Test Report 29 May 2024 | Test Report 29 May 2024 | Test Report 29 May 2024 | Test Report 29 May 2024 | |
| Semiconductor Die 1 | Test Report 2 Aug 2023 | Test Report 2 Aug 2023 | Test Report 2 Aug 2023 | Test Report 2 Aug 2023 | |
| Semiconductor Die 2 | Test Report 22 Oct 2019 | Test Report 22 Oct 2019 | Test Report 22 Oct 2019 | Test Report 22 Oct 2019 | |
| Semiconductor Die 3 | Test Report 2 Aug 2023 | Test Report 2 Aug 2023 | Test Report 2 Aug 2023 | Test Report 2 Aug 2023 | |
| Semiconductor Die 4 | Test Report 2 Aug 2023 | Test Report 2 Aug 2023 | Test Report 2 Aug 2023 | Test Report 2 Aug 2023 | |
| Semiconductor Die 5 | Test Report 18 Jun 2024 | Test Report 18 Jun 2024 | Test Report 18 Jun 2024 | Test Report 18 Jun 2024 | |
| For more information: contact us | |||||
| Note(s): |
|---|
| * NXP does not commit to providing this report for all product materials! |
| Disclaimer |
|---|
| All information in this document is furnished for exploratory or indicative purposes only. All information in this document is believed to be accurate and reliable. However, NXP does not give any representations or warranties as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. NXP may make changes to information published in this document at any time and without notice. Minor deviations may occur in the products from different manufacturing location. This document supersedes and replaces all information supplied prior to the publication hereof. Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights. |