201711004I:MC9328MX21 MC56F825x/MC56F824x 56F8013 Final Test Site Expansion from NXP-ATTJ to KESC Tianjin China
  • 产品更改通知
  • 201711004I

201711004I : MC9328MX21 MC56F825x/MC56F824x 56F8013 Final Test Site Expansion from NXP-ATTJ to KESC Tianjin China

NXP Semiconductors announces the Final Test site expansion for the MC9328MX21 MC56F825x/MC56F824x 56F8013 product associated with this notification from the current NXP-ATTJ Tianjin China Final Test site to the KESC Tianjin China Final Test site. Final Test site transfer was successfully qualified adhering to NXP specifications. Corresponding ZVEI Delta Qualification Matrix ID: SEM-TF-01Please see the attached files for additional details.

PCN类型 更改类别 发行日期 生效日期
Customer Information Notification Test location 21-Dec-2017 19-Jan-2018

变化的原因

Qualification of KESC Tianjin China is required for manufacturing flexibility and customer supply assurance.

受影响产品的识别

Product identification does not change

预期的影响

数据表的修订: No impact to existing datasheet

There is no change to product form fit function or reliability.

受影响的部分

零件号/ 12NC 上次购买日期 上次交货日期 备件
MC56F8246VLF
(935321556557)
- - -
MC56F8246VLFR
(935321556528)
- - -
MC9328MX21CVK
(935316662557)
- - -
MC9328MX21DVK
(935322225557)
- - -
S56F8013W3MFAE
(935314709557)
- - -