MMA1220KEG 产品信息|NXP

安全互联汽车

工业

消费电子

技术

MMA1220KEG

使用寿命终止

MMA1220KEG

使用寿命终止

购买选项

MMA1220KEG

使用寿命终止

12NC: 935310246574

详细信息

  • 包装: TUBE-Tube in Drypack
  • 最小封装数量: 47
  • 起订量: 47
  • 交付周期: 26 weeks
  • 预算报价（不含税）: 1K 在 US$5.67 USD

订购

替换部件

MMA1220KEGR2

使用寿命终止

12NC: 935310246518

详细信息

  • 包装: REEL-Reel 13" Q1/T1 in Drypack
  • 最小封装数量: 1000
  • 起订量: 1000
  • 交付周期: 26 weeks
  • 预算报价（不含税）: 1K 在 US$5.67 USD

订购

替换部件

工作特点

参数值
Security Status
COMPANY PUBLIC
Description
Analog Accelerometer, 5V, Z, 8g, SOIC 16
参数值
Number of pins
16
Package Style
SO

环境

部件/12NC无铅欧盟 RoHS无卤素RHF指标二级互连REACH SVHC重量（mg）
MMA1220KEG(935310246574)
No
Yes
Certificate Of Analysis (CoA)
No
E
e3
REACH SVHC
609.2
MMA1220KEGR2(935310246518)
No
Yes
Certificate Of Analysis (CoA)
No
E
e3
REACH SVHC
609.2

质量

部件/12NC安全保障功能安全湿度灵敏度等级(MSL)封装体峰值温度（PPT）（C°）Maximum Time at Peak Temperatures (s)
铅焊接铅焊接无铅焊接铅焊接无铅焊接
MMA1220KEG
(935310246574)
No
3
250
250
30
30
MMA1220KEGR2
(935310246518)
No
3
250
250
30
30

配送

部件/12NC协调关税 (美国)免责声明出口控制分类编号 (美国)
MMA1220KEG
(935310246574)
854239
EAR99
MMA1220KEGR2
(935310246518)
854239
EAR99

停产和更换部件数据

部件/12NC停产通知上次购买日期上次发货日期替代器件
MMA1220KEG
(935310246574)
NOTICE
2020-12-31
2021-12-31
-
MMA1220KEGR2
(935310246518)
NOTICE
2020-12-31
2021-12-31
-

产品变更通知

部件/12NC发行日期生效日期产品更改通知标题
MMA1220KEG
(935310246574)
2020-12-152020-12-16202011011INXP Will Add a Sealed Date to the Product Label
MMA1220KEGR2
(935310246518)
MMA1220KEG
(935310246574)
2018-12-192018-12-20201711018DNU02Product Discontinuation Notice - Align SOIC EOL Dates
MMA1220KEGR2
(935310246518)

更多信息 MMA1220

The MMA1220 family of silicon capacitive, micro-machined, accelerometers features signal conditioning, four-pole low-pass filter, and temperature compensation.

  • Targets industrial applications such as vibration monitoring/recording, bearing monitoring, hard drive protection, mouse/joysticks, virtual reality input devices, and sport diagnostics
  • Includes factory-set zero-g offset full-scale span and filter cut-off; requires no external devices
  • Verifies system functionality via full-system self-test capability