This is a modal window.
Beginning of dialog window. Escape will cancel and close the window.
End of dialog window.
This is a modal window. This modal can be closed by pressing the Escape key or activating the close button.
Sign in to access this content and additional site features.
NXP's RF GaN director Monte Miller discusses GaN and how NXP overcame the GaN memory effect to deliver high linearized efficiency RF solutions.