AI-based Anomaly Detection Solution with NXP and Basler for Industrial

Pinpoint anomalies across nearly any kind of manufacturing production line. Here we used NXP’s i.MX 8M Plus and its embedded NPU with eIQ^® machine learning libraries in this innovative approach to industrial vision inspection.

This demo, developed together with NXP’s partner Basler, shows how the solution can detect anomalies on a wafer pattern.