202207016F03:Introduction of Test and Pre-Assembly Capacity Extension for Blade Diced UCODE 9
  • 产品更改通知
  • 202207016F03

202207016F03 : Introduction of Test and Pre-Assembly Capacity Extension for Blade Diced UCODE 9

For the increase of production capacity we extend our wafer test and pre-assembly at NXP ATBK (Thailand) by: • Wafer test and pre-assembly at NXP ATKH (Taiwan); announced in the FPCN 202207016F01 • Pre-assembly at subcontractor Chipbond (Taiwan); announced in the FPCN 202207016F02 Next to these sites we will further expand our pre-assembly capacity at our NXP ATBK (Thailand) site by DBG (Dice before grind) in parallel to the existing process. To be noted: • There will be no change in type names or 12NCs (ordering code). • For the DBG pre-assembly process a different wafer foil already in use for plasma diced UCODE 9 products will be used.

PCN类型 更改类别 发行日期 生效日期
Final Product Change Notification Assembly processassembly materials 14-Dec-2022 14-Mar-2023

变化的原因

NXP strives to provide larger flexibility in the production fulfilment. Being able to process UCODE 9 blade diced wafer products at more than one source will increase capacity and supply stability.

预期的影响

数据表的修订: No impact to existing datasheet

For the DBG pre-assembly process a different wafer foil already in use for plasma diced UCODE products will be used.No impact on form fit function reliability or quality.

受影响的部分

零件号/ 12NC 上次购买日期 上次交货日期 备件
SL3S1206FUD2/HAA
(935396596046)
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