202110017I : i.MX RT1170 Chip Errata Update to Rev 1.3 and i.MX RT1160 Chip Errata Update to Rev 1.1

NXP Semiconductors announces an errata update to revision 1.3 for i.MX RT1170 and an errata update to revision 1.1 for i.MX RT1160. The revision history included in the updated documents provides a detailed description of the changes. Changes for both i.MX RT1170 and RT1160 are summarized below: • Added the following errata: – ERR051091: ADC: IO leakage current is observed when pins configured for ADC function – ERR051122: SNVS: Some fuse trim values are lost in SNVS mode • Revised the following errata with format change and no content change. – ERR006941: Core: Asynchronous sampling of SWDIOTMS might cause incorrect operation of SerialWire/JTAG Debug Port The i.MX RT1170 errata is attached to this notice and can be found at: https://www.nxp.com/products/processors-and-microcontrollers/arm-microcontrollers/i-mx-rt-crossover-mcus/i-mx-rt1170-crossover-mcu-family-first-ghz-mcu-with-arm-cortex-m7-and-cortex-m4-cores:i.MX-RT1170?tab=Documentation_Tab&linkline=Errata The i.MX RT1160 errata is attached to this notice and can be found at: https://www.nxp.com/products/processors-and-microcontrollers/arm-microcontrollers/i-mx-rt-crossover-mcus/i-mx-rt1160-crossover-mcu-family-high-performance-mcu-with-arm-cortex-m7-and-cortex-m4-cores:i.MX-RT1160?tab=Documentation_Tab&linkline=Errata Corresponding ZVEI Delta Qualification Matrix ID: SEM-DS-02

变化的原因

The errata was added or revised for additional technical clarification on some device features.

受影响的部分