202002004F01:SAC57D54H/53M/52L Die Thickness Increase to 280um For The 516MAPBGA 27*27
  • 产品更改通知
  • 202002004F01

202002004F01 : SAC57D54H/53M/52L Die Thickness Increase to 280um For The 516MAPBGA 27*27

NXP Semiconductors announces a change in die thickness for the SAC57D54H/ 53M/ 52L Mask Set N87P from the current 179um to 280um.The above change coincides with DeQuMa ID: SEM-PW-03.

PCN类型 更改类别 发行日期 生效日期
Final Product Change Notification Assembly process 12-Mar-2020 10-Jun-2020

变化的原因

Die thickness increase is to improve product quality reliability and C55 product family standardization.

受影响产品的识别

Product identification does not change

预期的影响

No impact on form fit function reliability or quality.

受影响的部分

零件号/ 12NC 上次购买日期 上次交货日期 备件
SAC57D53MCVMO
(935318864557)
- - -
SAC57D53MCVMOR
(935318864518)
- - -
SAC57D54HCVMO
(935313269557)
- - -
SAC57D54HCVMOR
(935313269518)
- - -