201902019F01 : PCA8565AU Wafer and PCA8565TS/1 Test Transfer from ATKH to ATBK
Move all of electrical wafer testing and final testing of PCA8565TS/1 from ATKH (STS platform) to ATBK (SPEA test platform).
| PCN类型 | 更改类别 | 发行日期 | 生效日期 |
|---|---|---|---|
| Final Product Change Notification | Test location | 08-Mar-2019 | 06-Jun-2019 |
变化的原因
Test platform improvement allowing for less downtime.
受影响产品的识别
Product identification does not change
预期的影响
No impact on form fit function reliability or quality.
受影响的部分
| 零件号/ 12NC | 上次购买日期 | 上次交货日期 | 备件 |
|---|---|---|---|
|
PCA8565TS/1,118 (935272132118) |
- | - | None |