201801012F01 : i.MX 6SoloX MAPBGA17X17 and MAPBGA14X14 Room Test Elimination at Final Test
NXP Semiconductors announces the room temperature test elimination from the Final Test production flow for i.MX 6SoloX MAPBGA17X17 and MAPBGA14X14 devices associated with this notification. Room test performance is covered by Probe Test and the remaining Final Test production flow. Current Production Final Test Flow:Hot Final Test - Cold Final Test - Room Final Test with in-line QA Gate TestsNew Production Final Test Flow:Hot Final Test - Cold Final Test with in-line QA Gate TestsThis evaluation has been successfully completed according to NXP specifications.Corresponding ZVEI Delta Qualification Matrix ID: SEM-QG-01
| PCN类型 | 更改类别 | 发行日期 | 生效日期 |
|---|---|---|---|
| Final Product Change Notification | Test process | 14-Feb-2018 | 15-May-2018 |
变化的原因
Qualification of room temperature test elimination for improved capacity and customer supply assurance
受影响产品的识别
Product identification does not change
预期的影响
No impact on form fit function reliability or quality.
受影响的部分
| 零件号/ 12NC | 上次购买日期 | 上次交货日期 | 备件 |
|---|---|---|---|
|
MCIMX6X1AVK08AB (935315934557) |
- | - | - |
|
MCIMX6X1AVK08AC (935363026557) |
- | - | - |
|
MCIMX6X1AVO08AB (935323753557) |
- | - | - |
|
MCIMX6X1AVO08AC (935353852557) |
- | - | - |
|
MCIMX6X1AVO08ACR (935353852518) |
- | - | - |
|
MCIMX6X2AVN08AB (935315812557) |
- | - | - |
|
MCIMX6X2AVN08AC (935363894557) |
- | - | - |