设计中心
培训
IoT Devices with Embedded Observability

Higher Quality, Better Performing IoT Devices with Embedded Observability

About This Training

NXP and Memfault have collaborated to give IoT device manufacturers in-field device monitoring, crash reporting and updating capabilities for faster product development, improved device operation and reduced direct resource costs.

Together, Memfault and NXP are helping IoT developers build smart cities, smart homes, IIoT and automotive devices to save time and ease the worry of triaging and troubleshooting, allowing them to focus on building value-added features.

What You Will Learn

Gain deep insights into embedded device performance in a cloud-based environment
Access debugging information without requiring any user interaction, device RMAs or on-site visits
Orchestrate complex OTA updates of firmware in an organized and controlled manner
Get started with a project example using Memfault and NXP i.MX RT1060 MCUs

Presented by

Kyle Dando
Development Systems Application Engineer, NXP Semiconductors
Devon Yablonski
Head of Strategic Partnerships, Memfault

时长

1 hr 5 min

语言

英语

技术级别

初级

0观看次数0赞

我们致力于不断提升。

欢迎参加调查问卷。

Additional Resources

Stay In the Loop

Subscribe to our newsletter to stay updated with our latest developments and if you need further assistance, we are here to help.

Subscribe Contact Support